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(99)
    • €410.50 €488.50
      Art.Nr: E80124-PT
      SPM Calibration Specimen, random hard and soft domain as small as 10nm, Polymer, mounted on 15mm steel disk.
      €410.50 €488.50
      • €668.20 €795.16
        Art.Nr: E80124-HD
        SPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.
        €668.20 €795.16
        • €772.10 €918.80
          Art.Nr: E80124-EDU
          SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
          €772.10 €918.80
          • €1,680.70 €2,000.03
            Art.Nr: E80123-2D
            SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
            €1,680.70 €2,000.03
            • €870.80 €1,036.25
              Art.Nr: E80123-1D
              SPM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
              €870.80 €1,036.25
              • €1,312.80 €1,562.23
                Art.Nr: E80122-2D
                SPM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
                €1,312.80 €1,562.23
                • €734.50 €874.06
                  Art.Nr: E80122-1D
                  SPM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
                  €734.50 €874.06
                  • €2,468.40 €2,937.40
                    Art.Nr: E80111-31M
                    SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.
                    €2,468.40 €2,937.40
                    • €2,245.00 €2,671.55
                      Art.Nr: E80111-31
                      SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.
                      €2,245.00 €2,671.55
                      • €1,476.80 €1,757.39
                        Art.Nr: E80110-72M
                        SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.
                        €1,476.80 €1,757.39
                        • €1,249.80 €1,487.26
                          Art.Nr: E80110-72
                          SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                          €1,249.80 €1,487.26
                          • €852.20 €1,014.12
                            Art.Nr: E80110-71M
                            SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.
                            €852.20 €1,014.12
                            • €699.70 €832.64
                              Art.Nr: E80110-71
                              SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                              €699.70 €832.64
                              • Art.Nr: E80110-32M
                                SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
                                • Art.Nr: E80110-32
                                  SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                                  • €1,056.90 €1,257.71
                                    Art.Nr: E80110-31M
                                    SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
                                    €1,056.90 €1,257.71
                                    • €830.00 €987.70
                                      Art.Nr: E80110-31
                                      SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                                      €830.00 €987.70
                                      • Art.Nr: TL80069
                                        The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.
                                        • €113.50 €135.07
                                          Art.Nr: E80055
                                          The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.
                                          €113.50 €135.07
                                          • €109.70 €130.54
                                            Art.Nr: E80051
                                            Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.
                                            €109.70 €130.54
                                            • €98.60 €117.33
                                              Art.Nr: E80050
                                              Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.
                                              €98.60 €117.33
                                              • €41.50 €49.39
                                                Art.Nr: P80037
                                                Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                                €41.50 €49.39
                                                • €59.50 €70.81
                                                  Art.Nr: P80036
                                                  Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                                  €59.50 €70.81
                                                  • €38.10 €45.34
                                                    Art.Nr: P80035
                                                    Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                                    €38.10 €45.34
                                                    • €38.10 €45.34
                                                      Art.Nr: P80020
                                                      Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.
                                                      €38.10 €45.34
                                                      • €84.20 €100.20
                                                        Art.Nr: P80014
                                                        Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.
                                                        €84.20 €100.20
                                                        • €19.50 €23.21
                                                          Art.Nr: E80010
                                                          Holey Carbon Film for measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various Sizes. On a 3.05mm copper grid.
                                                          €19.50 €23.21
                                                          • Art.Nr: P79526-10
                                                            These fine mesh grids are suitable for the low magnification range of a TEM.
                                                            • €82.20 €97.82
                                                              Art.Nr: E79525-02
                                                              These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.
                                                              €82.20 €97.82
                                                              • €41.50 €49.39
                                                                Art.Nr: P79525-01
                                                                These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.
                                                                €41.50 €49.39