Size Standards
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€410.50 €488.50Art.Nr: E80124-PTSPM Calibration Specimen, random hard and soft domain as small as 10nm, Polymer, mounted on 15mm steel disk.€410.50 €488.50
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€668.20 €795.16Art.Nr: E80124-HDSPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.€668.20 €795.16
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€772.10 €918.80Art.Nr: E80124-EDUSPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€772.10 €918.80
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€1,680.70 €2,000.03Art.Nr: E80123-2DSPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.€1,680.70 €2,000.03
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€870.80 €1,036.25Art.Nr: E80123-1DSPM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.€870.80 €1,036.25
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€1,312.80 €1,562.23Art.Nr: E80122-2DSPM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.€1,312.80 €1,562.23
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€734.50 €874.06Art.Nr: E80122-1DSPM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.€734.50 €874.06
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€2,468.40 €2,937.40Art.Nr: E80111-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.€2,468.40 €2,937.40
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€2,245.00 €2,671.55Art.Nr: E80111-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.€2,245.00 €2,671.55
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€1,476.80 €1,757.39Art.Nr: E80110-72MSEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,476.80 €1,757.39
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€1,249.80 €1,487.26Art.Nr: E80110-72SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€1,249.80 €1,487.26
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€852.20 €1,014.12Art.Nr: E80110-71MSEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€852.20 €1,014.12
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€699.70 €832.64Art.Nr: E80110-71SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€699.70 €832.64
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Art.Nr: E80110-32MSEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
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Art.Nr: E80110-32SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
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€1,056.90 €1,257.71Art.Nr: E80110-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,056.90 €1,257.71
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€830.00 €987.70Art.Nr: E80110-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€830.00 €987.70
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Art.Nr: TL80069The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.
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€113.50 €135.07Art.Nr: E80055The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.€113.50 €135.07
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€109.70 €130.54Art.Nr: E80051Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.€109.70 €130.54
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€98.60 €117.33Art.Nr: E80050Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.€98.60 €117.33
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€41.50 €49.39Art.Nr: P80037Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€41.50 €49.39
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€59.50 €70.81Art.Nr: P80036Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€59.50 €70.81
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€38.10 €45.34Art.Nr: P80035Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€38.10 €45.34
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€38.10 €45.34Art.Nr: P80020Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.€38.10 €45.34
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€84.20 €100.20Art.Nr: P80014Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.€84.20 €100.20
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€19.50 €23.21Art.Nr: E80010Holey Carbon Film for measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various Sizes. On a 3.05mm copper grid.€19.50 €23.21
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Art.Nr: P79526-10These fine mesh grids are suitable for the low magnification range of a TEM.
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€82.20 €97.82Art.Nr: E79525-02These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.€82.20 €97.82
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€41.50 €49.39Art.Nr: P79525-01These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.€41.50 €49.39