Size Standards

The Checkerboard Calibration Standard is a precise instrument for magnification and image calibration of Scanning Electron Microscopes (SEM). It features a complex checkerboard pattern with feature sizes ranging from 1µm to 5mm, fabricated using 60nm thick chromium on a conductive silicon substrate. The standard is suitable for magnifications from 20x to 50,000x with an accuracy of ±0.1% and is NIST traceable. It is designed for both calibration and image distortion checks and is available in various mounting options.