The Checkerboard Calibration Standard is a precise instrument for magnification and image calibration of Scanning Electron Microscopes (SEM). It features a complex checkerboard pattern with feature sizes ranging from 1µm to 5mm, fabricated using 60nm thick chromium on a conductive silicon substrate. The standard is suitable for magnifications from 20x to 50,000x with an accuracy of ±0.1% and is NIST traceable. It is designed for both calibration and image distortion checks and is available in various mounting options.
With GATTA‑AFM nanorulers, now adequate test samples are finally available. The GATTA-AFM nanorulers represent accurate and highly parallelized structures and are therefore perfectly suited to optimize and test the resolution of atomic force microscopes.