The Checkerboard Calibration Standard is a precise instrument for magnification and image calibration of Scanning Electron Microscopes (SEM). It features a complex checkerboard pattern with feature sizes ranging from 1µm to 5mm, fabricated using 60nm thick chromium on a conductive silicon substrate. The standard is suitable for magnifications from 20x to 50,000x with an accuracy of ±0.1% and is NIST traceable. It is designed for both calibration and image distortion checks and is available in various mounting options.
This ideal standard provides accurate calibration of any eyepiece, reticules, filar micrometers, or electronic measuring instrument. Useful for calibration range from 1X to 1000X power.
This ideal standard provides accurate calibration of any eyepiece, reticules, filar micrometers, or electronic measuring instrument. Useful for calibration range from 1X to 1000X power.
This standard can be used to test not only the overall frame distortion issue, but also linear distances for a wide variety of magnification ranges from 1x to 1000x power.
This standard can be used to test not only the overall frame distortion issue, but also linear distances for a wide variety of magnification ranges from 1x to 1000x power.
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
A dual axis linear micrometer that can accurately calibrate X & Y directions without rotation, for optical magnification, and camera aspect ratio using single standard.
A dual axis linear micrometer that can accurately calibrate X & Y directions without rotation, for optical magnification, and camera aspect ratio using single standard.
The IAM-MET is a multi-morphology calibration standard designed for ASTM. Includes all plates as found in IAM-1 except for plate 4. This plate contains 9 images of irregular shapes, simulating features commonly found in metallurgical applications.
Vision Calibration Standard, includes a set of eight test plates of various shapes, positions, angles and Sizes. It also includes a linear measurement scale for calibrating your imaging system. Overall Size: 25x75mm.
Vision Calibration Standard, includes a set of eight test plates of various shapes, positions, angles and Sizes. It also includes a linear measurement scale for calibrating your imaging system. Overall Size: 25x75mm.
Glass Size: 25x75mm. Scale Length: 0,08 inch (English) X & Y axis, 2.0mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). No numerical scale labeling.
Glass Size: 25x75mm. Scale Length: 0,08 inch (English) X & Y axis, 2.0mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). No numerical scale labeling.
Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,0005”, Metric = 10µm (0,010 mm). With numerical labeling every 0,1 mm and 0,05”.
Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,0005”, Metric = 10µm (0,010 mm). With numerical labeling every 0,1 mm and 0,05”.
Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). With numerical labeling every 1 mm and 0,1”.
Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). With numerical labeling every 1 mm and 0,1”.
Glass Size: 25x75mm. Scale Length: 0,04 inch (English) X & Y axis, 10mm (Metric) X &Y axis. Teilung: English = 0,01”, Metric = 100µm (0,1mm). English = 0,0005”, Metric = 10µm (0,010mm). With numerical labeling every 0,1 mm and 0,05”.
Glass Size: 25x75mm. Scale Length: 0,04 inch (English) X & Y axis, 10mm (Metric) X &Y axis. Teilung: English = 0,01”, Metric = 100µm (0,1mm). English = 0,0005”, Metric = 10µm (0,010mm). With numerical labeling every 0,1 mm and 0,05”.
Glass Size: 50x132mm. Scale Length: 5 inch (English) X-axis only, 125mm (Metric) X-axis only. Teilung: English = 0,01”, Metric = 100µm (0,1mm). With numerical labeling every 1 mm and 0,1”.
Glass Size: 50x132mm. Scale Length: 5 inch (English) X-axis only, 125mm (Metric) X-axis only. Teilung: English = 0,01”, Metric = 100µm (0,1mm). With numerical labeling every 1 mm and 0,1”.