Size Standards

The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.

Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.

Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.

Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.

Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.

These fine mesh grids are suitable for the low magnification range of a TEM.

These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.

This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.

This ideal standard provides accurate calibration of any eyepiece, reticules, filar micrometers, or electronic measuring instrument. Useful for calibration range from 1X to 1000X power.

This ideal standard provides accurate calibration of any eyepiece, reticules, filar micrometers, or electronic measuring instrument. Useful for calibration range from 1X to 1000X power.

This standard can be used to test not only the overall frame distortion issue, but also linear distances for a wide variety of magnification ranges from 1x to 1000x power.

This standard can be used to test not only the overall frame distortion issue, but also linear distances for a wide variety of magnification ranges from 1x to 1000x power.

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.

A dual axis linear micrometer that can accurately calibrate X & Y directions without rotation, for optical magnification, and camera aspect ratio using single standard.

A dual axis linear micrometer that can accurately calibrate X & Y directions without rotation, for optical magnification, and camera aspect ratio using single standard.

The IAM-MET is a multi-morphology calibration standard designed for ASTM. Includes all plates as found in IAM-1 except for plate 4. This plate contains 9 images of irregular shapes, simulating features commonly found in metallurgical applications.

Vision Calibration Standard, includes a set of eight test plates of various shapes, positions, angles and Sizes. It also includes a linear measurement scale for calibrating your imaging system. Overall Size: 25x75mm.

Vision Calibration Standard, includes a set of eight test plates of various shapes, positions, angles and Sizes. It also includes a linear measurement scale for calibrating your imaging system. Overall Size: 25x75mm.

Glass Size: 25x75mm. Scale Length: 0,08 inch (English) X & Y axis, 2.0mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). No numerical scale labeling.

Glass Size: 25x75mm. Scale Length: 0,08 inch (English) X & Y axis, 2.0mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). No numerical scale labeling.

Glass Size: 25x75mm. Scale Length: 0,08 inch (English) X-axis only, 2.0mm (Metric) X-axis only. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). No numerical scale labeling.

Glass Size: 25x75mm. Scale Length: 0,08 inch (English) X-axis only, 2.0mm (Metric) X-axis only. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). No numerical scale labeling.

Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,0005”, Metric = 10µm (0,010 mm). With numerical labeling every 0,1 mm and 0,05”.

Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,0005”, Metric = 10µm (0,010 mm). With numerical labeling every 0,1 mm and 0,05”.

Glass Size: 38x75mm. Scale Length: 1 inch (English) X & Y axis, 25mm (Metric) X & Y axis. Teilung: English = 0,001”, Metric = 25µm (0,025 mm). With numerical labeling every 1 mm and 0,1”.