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Size Standards
(33)
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Starting at €453.90 €540.14
Mikrometer Scala 20mm in 0,01mm Teilung.This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background. The glas discs are mounted in stainless steel slides.Starting at €453.90 €540.14
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Starting at €342.40 €407.46
Type: horizontal, Length: 0,1", Nos. Div.: 100, Div. Size: 0,001". The glas discs are mounted in stainless steel slides.Starting at €342.40 €407.46
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Starting at €380.40 €452.68
Type: horizontal, Length: 10mm, Nos. Div.: 100, Div. Size: 0,1mm. The glas discs are mounted in stainless steel slides.Starting at €380.40 €452.68
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Starting at €275.60 €327.96
Type: horizontal, Length: 10mm, Nos. Div.: 100, Div. Size: 0,1mm.Starting at €275.60 €327.96
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Starting at €275.60 €327.96
Type: horizontal, Length: 0,1", Nos. Div.: 100, Div. Size: 0,001".Starting at €275.60 €327.96
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Starting at €342.40 €407.46
Mikrometer Scala 1mm in 0,01mm Teilung.This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background. The glas discs are mounted in stainless steel slides.Starting at €342.40 €407.46
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Starting at €275.60 €327.96
Mikrometer Skala 1mm in 0,01mm Teilung.This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background.Starting at €275.60 €327.96
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€7,830.50 €9,318.30Art.Nr: E80127-1DCVery High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB. A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.€7,830.50 €9,318.30 -
€1,312.80 €1,562.23Art.Nr: E80125-1DSPM Calibration Specimen, parallel ridges, 150nm nominal Abstand, A1 Lines on Glass, unmounted.€1,312.80 €1,562.23 -
€668.20 €795.16Art.Nr: E80124-HDSPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.€668.20 €795.16
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€772.10 €918.80Art.Nr: E80124-EDUSPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€772.10 €918.80
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€2,468.40 €2,937.40Art.Nr: E80111-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.€2,468.40 €2,937.40
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€2,245.00 €2,671.55Art.Nr: E80111-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.€2,245.00 €2,671.55
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€1,476.80 €1,757.39Art.Nr: E80110-72MSEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,476.80 €1,757.39
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€1,249.80 €1,487.26Art.Nr: E80110-72SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€1,249.80 €1,487.26
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€852.20 €1,014.12Art.Nr: E80110-71MSEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€852.20 €1,014.12
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€699.70 €832.64Art.Nr: E80110-71SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€699.70 €832.64
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Art.Nr: E80110-32MSEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
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Art.Nr: E80110-32SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
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€1,056.90 €1,257.71Art.Nr: E80110-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,056.90 €1,257.71
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€830.00 €987.70Art.Nr: E80110-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€830.00 €987.70
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€84.20 €100.20Art.Nr: P80014Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.€84.20 €100.20 -
€610.10 €726.02 -
€60.00 €71.40Art.Nr: P79502-20This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.€60.00 €71.40
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€45.40 €54.03Art.Nr: P79502-12This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.€45.40 €54.03
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€432.10 €514.20Art.Nr: P79502-10This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.€432.10 €514.20
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€44.60 €53.07Art.Nr: P79502-01This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.€44.60 €53.07
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€1,773.50 €2,110.47Art.Nr: E60216-5LNGCThis ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.€1,773.50 €2,110.47 -
€664.10 €790.28Art.Nr: E60216-5LNGThis ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.€664.10 €790.28
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€2,012.70 €2,395.11Art.Nr: E60216-5MNGCThis ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.€2,012.70 €2,395.11
