Size Standards

Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB. A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.

SPM Calibration Specimen, parallel ridges, 150nm nominal Abstand, A1 Lines on Glass, unmounted.

SPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.

SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.

SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.

SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.

SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.

SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.

SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.

SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.

SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.

SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.

SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.

SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.

The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.

The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.

Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.

Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.

Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.

Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.

Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.

Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.

Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.

Holey Carbon Film for measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various Sizes. On a 3.05mm copper grid.

These fine mesh grids are suitable for the low magnification range of a TEM.

These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.

These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.

This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.

This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.