AFM, SEM Calibration Specimens 302-EDU, unmounted
E80124-EDU
SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
€772.10
€918.80
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Application |
SEM
|
---|---|
Type |
Calibration Standards
|
Packing Unit | each |
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